smartctl 6.2 2013-07-26 r3841 [i686-linux-3.13.0-37-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Hitachi Deskstar 7K160 Device Model: Hitachi HDS721616PLAT80 Serial Number: PV5301Z9SP241M LU WWN Device Id: 5 000cca 334d7ab4b Firmware Version: P22OA85A User Capacity: 164,695,473,664 bytes [164 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-7 T13/1532D revision 1 Local Time is: Thu Aug 20 21:01:16 2015 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 2865) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 48) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 121 121 024 Pre-fail Always - 165 (Average 165) 4 Start_Stop_Count 0x0012 099 099 000 Old_age Always - 5735 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 098 098 000 Old_age Always - 19676 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 4767 192 Power-Off_Retract_Count 0x0032 095 095 000 Old_age Always - 6091 193 Load_Cycle_Count 0x0012 095 095 000 Old_age Always - 6091 194 Temperature_Celsius 0x0002 127 127 000 Old_age Always - 47 (Min/Max 15/58) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 1 SMART Error Log Version: 1 ATA Error Count: 10 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 10 occurred at disk power-on lifetime: 17906 hours (746 days + 2 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 02 71 04 e8 e0 Error: ICRC, ABRT 2 sectors at LBA = 0x00e80471 = 15205489 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 02 71 04 e8 e0 00 00:18:49.100 READ DMA EXT 35 00 08 38 f6 b8 e0 00 00:18:48.500 WRITE DMA EXT 35 00 80 f0 ac 6a e0 00 00:18:48.500 WRITE DMA EXT 25 00 02 71 04 e8 e0 00 00:18:48.100 READ DMA EXT 25 00 02 71 04 e8 e0 00 00:18:47.100 READ DMA EXT Error 9 occurred at disk power-on lifetime: 9494 hours (395 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 ed eb af e2 Error: UNC 8 sectors at LBA = 0x02afebed = 45083629 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 ed eb af e0 00 00:02:06.000 READ DMA EXT 25 00 01 00 00 00 e0 00 00:02:06.000 READ DMA EXT 25 00 08 ed eb af e0 00 00:02:00.500 READ DMA EXT 25 00 01 00 00 00 e0 00 00:02:00.400 READ DMA EXT 25 00 20 4e fc 4b e0 00 00:02:00.400 READ DMA EXT Error 8 occurred at disk power-on lifetime: 9494 hours (395 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 ed eb af e2 Error: UNC 8 sectors at LBA = 0x02afebed = 45083629 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 ed eb af e0 00 00:02:00.500 READ DMA EXT 25 00 01 00 00 00 e0 00 00:02:00.400 READ DMA EXT 25 00 20 4e fc 4b e0 00 00:02:00.400 READ DMA EXT 25 00 08 ed eb af e0 00 00:01:54.900 READ DMA EXT 25 00 08 65 47 bc e0 00 00:01:54.900 READ DMA EXT Error 7 occurred at disk power-on lifetime: 9494 hours (395 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 ed eb af e2 Error: UNC 8 sectors at LBA = 0x02afebed = 45083629 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 ed eb af e0 00 00:01:54.900 READ DMA EXT 25 00 08 65 47 bc e0 00 00:01:54.900 READ DMA EXT 25 00 08 a5 5f d4 e0 00 00:01:54.900 READ DMA EXT 25 00 08 9d 5f d4 e0 00 00:01:54.900 READ DMA EXT 25 00 08 95 5f d4 e0 00 00:01:54.900 READ DMA EXT Error 6 occurred at disk power-on lifetime: 9494 hours (395 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 ed eb af e2 Error: UNC 8 sectors at LBA = 0x02afebed = 45083629 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 08 ed eb af e0 00 00:01:00.400 READ DMA EXT 25 00 08 ed eb af e0 00 00:00:54.800 READ DMA EXT 25 00 08 65 47 bc e0 00 00:00:54.800 READ DMA EXT 25 00 08 5d 13 d1 e0 00 00:00:54.800 READ DMA EXT 25 00 08 7d 68 a0 e0 00 00:00:54.800 READ DMA EXT SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 19632 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.